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Registered in England and Wales company # 03449181.
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 © Copyright: Conwy Valley Systems Limited  2000-2024

Conwy Valley Systems Limited,

West Acre, Llys Helyg, Deganwy

CONWY LL31 9BN, United Kingdom.

VAT# GB 741 5190 48

A Geoscience Wales  founding member.

PETROG includes patent protected technology.

Sharing with other PETROG systems: PETROG has its own open import and export file format.

Data Exchange

Importing data into PETROG

PETROG is designed to support petrographers, whatever their specialist application. In addition to high levels of customisation, to make the application as easy and friendly to use as possible, support is provided for specific data collection and analysis requirements, including: XRD data, Core Analysis data, XRF data. Importing these data types is made as simple as possible, minimising the need to reformat data.

As well as importing raw data, images can be added to the database. Images collected from other sources can be analysed using PETROG’s digital data collection, extending the petrographic analysis to include SEM images and XRD data. Also, because PETROG provides unique tools for assisting the image analysis of thin sections, extending the value of point counting through a patented AI methodology.

Exporting Data from PETROG

PETROG provides tools for exporting to specific formats (such as Touchstone Exemplar) as well as creating formats on the fly, through an easy-to-use report generator.

Application Support

PETROG is designed to support petrographers, whatever their specialist application. In addition to high levels of customisation, to make the application as easy and friendly to use as possible, support is provided for specific data collection and analysis requirements, including:

PETROG provides unique tools for assisting the image analysis of dyed thin sections, extending the value of point counting through a patented AI methodology.

Images collected from other sources can be analysed using PETROG’s digital data collection, extending the petrographic analysis to include SEM images and XRD data.